High-resolution imaging using focused electron beam for detailed material analysis at nanoscale.
A means of obtaining high-resolution, three-dimensional-like images of solid samples.
Extends the usefulness of SEM in that elemental analysis can be performed within regions as small as a few cubic micrometers.
DSC measures material heat capacity changes by temperature.
TGA is a type of thermal analysis that examines the thermal stability
of a material.
The FTIR System provides high performance with a wide variety of sampling options.
an analytical method for characterizing the crystallographic structure of a material.
Micron Inc. provides a truly independent laboratory with no ties to either party involved in the litigation.
One of the most critical steps in any analysis is the proper preparation of the sample before the analysis.
Characterizes the morphological features of material over a wide range of magnifications (0.5X-1500X).
Visualize internal structures of Welds, Castings, Corrosion, Circuit Boards, and more.
A procedure used to produce a specimen in which the microstructure can be observed.