What is Field Emission Scanning Electron Microscopy (FE-SEM)?

FE-SEM is a means for obtaining very high resolution three dimensional like images of solid samples. Variation in the surface topography of a material are depicted as variations in gray scale level of the image.

What Information can Field Emission Scanning Electron Microscopy (FE-SEM)?

FE-SEM can capture detailed images with a resolution as small as 1 nanometer on most samples. Micron Inc. utilizes a JEOL IT700HR/LA Field Emission instrument with low vacuum mode to routinely capture images of samples ranging in magnifications from 8X to 300,000X magnification. The JEOL IT700HR/LA FE-SEM has additional features, such as a large sample chamber that can accommodate samples with maximum dimensions of 126 mm (length) x 100 mm (width) x 80 mm(height)

What Materials can be analyzed using Field Emission Scanning Electron Microscopy (FE-SEM)?

Any solid materials such as metals, polymers, ceramics, pharmaceuticals, powders, fracture surfaces, and much more.

Sample Stage
Electron Gun

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