X-Ray Diffraction

X-Ray Diffraction (XRD) is an analytical method for characterizing the crystallographic structure of a material.

Computer matching of the x-ray diffraction pattern with the ICDD files allows rapid identification of unknown crystalline substances.

Quantitative analysis for specific crystalline phases or compounds can also be obtained with standards.

Computerized X-Ray Diffractometer methods are routinely employed.

X-Ray Diffraction

Sample Size Requirements:

Powders (minimum 150-200mg) < 10μ particle size

Solid samples 35 x 35mm x 2mm thick or less

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