X-Ray Diffraction
X-Ray Diffraction (XRD) is an analytical method for characterizing the crystallographic structure of a material.
Computer matching of the x-ray diffraction pattern with the ICDD files allows rapid identification of unknown crystalline substances.
Quantitative analysis for specific crystalline phases or compounds can also be obtained with standards.
Computerized X-Ray Diffractometer methods are routinely employed.
Sample Size Requirements:
Powders (minimum 150-200mg) < 10μ particle size
Solid samples 35 x 35mm x 2mm thick or less
